John P. Hayes Recognized with ACM SIGDA Pioneering Achievement Award

Hayes was recognized “for his pioneering contributions to logic design, fault tolerant computing, and testing.”

Prof. John Hayes Enlarge
Prof. John Hayes

John P. Hayes, Claude E. Shannon Professor of Engineering Science, has been recognized with the 2014 ACM SIGDA Pioneering Achievement Award “for his pioneering contributions to logic design, fault tolerant computing, and testing.” The award was presented to him at the 2014 International Conference on Computer-Aided Design (ICCAD), which took place Nov. 2-6, 2014 in San Jose, CA. It is given once annually and recognizes early work that has played a pivotal role in the design of electronic systems.

Prof. Hayes teaches and conducts research in the general area of computer science and engineering, with specific interests in computer hardware design, computer-aided design and testing, VLSI circuits, reliable computer architecture, and quantum computing. He earned his B.E. degree in electrical engineering from the National University of Ireland, Dublin, and his M.S. and Ph.D. degrees from the University of Illinois at Urbana-Champaign. He joined the faculty at Michigan in 1982; prior to that he was on the faculty of the University of Southern California. Prof. Hayes also worked in industry for a couple of years, and has held visiting positions at Stanford University, McGill University, the University of Montreal, Logicvision Inc., and the University of Freiburg.

Prof. Hayes was the founding director of Michigan’s Advanced Computer Architecture Laboratory. He is author of seven books, including Computer Architecture and Organization, (McGraw-Hill, 3rd ed. 1998), Quantum Circuit Simulation (Springer, 2009) and Design, Analysis and Test of Logic Circuits under Uncertainty (Springer, 2012), as well as over 275 technical papers and several patents. He received the University of Michigan’s Distinguished Faculty Award in 1999, the Alexander von Humboldt Foundation’s Research Prize in 2004, and the IEEE Test Technology Council Lifetime Contribution Medal in 2013. Prof. Hayes is a Fellow of both IEEE and ACM.